Traditional test generation methodologies for peripheral cores are performed by a skilled test engineer, leading to long generation times. In this paper a test generation methodolo...
Abstract: Test methodologies for large embedded systems fail to reflect the test process as a whole. Instead, the test process is divided into independent test levels feaifferences...
A discrete control system, with stringent hardware constraints, is effectively an embedded real-time system and hence requires a rigorous methodology to develop the software invol...
Lucas Cordeiro, Carlos Mar, Eduardo Valentin, Fabi...
Software-based self-test (SBST) is an emerging approach to address the challenges of high-quality, at-speed test for complex programmable processors and systems-on chips (SoCs) th...
Li Chen, Srivaths Ravi, Anand Raghunathan, Sujit D...
Crosstalk effects degrade the integrity of signals traveling on long interconnects and must be addressed during manufacturing testing. External testing for crosstalk is expensive ...