We describe techniques for diagnosing errors in formal equivalence checking of RTL and transistor level models of high performance microprocessors at Freescale Semiconductor Inc. ...
The problem of diagnosis – or locating the source of an error or fault – occurs in several areas of Computer Aided Design, such as dynamic verification, property checking, eq...
Technology scaling in integrated circuits has consistently provided dramatic performance improvements in modern microprocessors. However, increasing device counts and decreasing o...
Often network components work correctly, yet end-to-end services don’t. This happens if configuration parameters of components are set to incorrect values. Configuration is a fu...
Recent studies have suggested that the soft-error rate in microprocessor logic will become a reliability concern by 2010. This paper proposes an efficient error detection techniqu...
Jared C. Smolens, Brian T. Gold, Jangwoo Kim, Baba...