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ISCAS
2007
IEEE
173views Hardware» more  ISCAS 2007»
14 years 1 months ago
Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM
— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
Riaz Naseer, Younes Boulghassoul, Jeff Draper, San...
PPOPP
2005
ACM
14 years 1 months ago
Fault tolerant high performance computing by a coding approach
As the number of processors in today’s high performance computers continues to grow, the mean-time-to-failure of these computers are becoming significantly shorter than the exe...
Zizhong Chen, Graham E. Fagg, Edgar Gabriel, Julie...
IOLTS
2008
IEEE
117views Hardware» more  IOLTS 2008»
14 years 2 months ago
Verification and Analysis of Self-Checking Properties through ATPG
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
Marc Hunger, Sybille Hellebrand
CCGRID
2006
IEEE
14 years 1 months ago
Proposal of MPI Operation Level Checkpoint/Rollback and One Implementation
With the increasing number of processors in modern HPC(High Performance Computing) systems, there are two emergent problems to solve. One is scalability, the other is fault tolera...
Yuan Tang, Graham E. Fagg, Jack Dongarra
DAC
2011
ACM
12 years 7 months ago
Understanding the impact of power loss on flash memory
Flash memory is quickly becoming a common component in computer systems ranging from music players to mission-critical server systems. As flash plays a more important role, data ...
Hung-Wei Tseng, Laura M. Grupp, Steven Swanson