122 search results - page 19 / 25 » Error tolerant associative memory |
UAI
2008
13 years 9 months ago
2008
This paper describes a new algorithm to solve the decision making problem in Influence Diagrams based on algorithms for credal networks. Decision nodes are associated to imprecise...
MICRO
2009
IEEE
14 years 2 months ago
2009
IEEE
Process variations in integrated circuits have significant impact on their performance, leakage and stability. This is particularly evident in large, regular and dense structures...
CSREAESA
2009
13 years 8 months ago
2009
A Built-In Self-Test (BIST) approach is presented for the Internal Configuration Access Port (ICAP) and Frame Error Correcting Code (ECC) logic cores embedded in Xilinx Virtex-4 an...
IWMM
2010
Springer
14 years 13 days ago
2010
Springer
Temporal memory safety errors, such as dangling pointer dereferences and double frees, are a prevalent source of software bugs in unmanaged languages such as C. Existing schemes t...
HPCA
2008
IEEE
14 years 8 months ago
2008
IEEE
The continued scaling of device dimensions and the operating voltage reduces the critical charge and thus natural noise tolerance level of transistors. As a result, circuits can p...