72 search results - page 5 / 15 » Estimation and optimization of reliability of noisy digital ... |
SLIP
2005
ACM
14 years 1 months ago
2005
ACM
Routability optimization has become a major concern in the physical design cycle of VLSI circuits. Due to the recent advances in VLSI technology, interconnect has become a dominan...
ISQED
2006
IEEE
14 years 1 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
ICCD
2007
IEEE
14 years 1 months ago
2007
IEEE
A methodology for constructing circuit-level mismatch models and performing yield optimization is presented for CMOS analog circuits. The methodology combines statistical techniqu...
ICCAD
1998
IEEE
13 years 12 months ago
1998
IEEE
Noise can cause digital circuits to switch incorrectly and thus produce spurious results. Noise can also have adverse power, timing and reliability e ects. Dynamic logic is partic...
FPGA
2010
ACM
13 years 5 months ago
2010
ACM
Metastability is a phenomenon that can cause system failures in digital circuits. It may occur whenever signals are being transmitted across asynchronous or unrelated clock domain...