201 search results - page 19 / 41 » Evaluating Run-Time Techniques for Leakage Power Reduction |
VLSID
2005
IEEE
14 years 8 months ago
2005
IEEE
Abstract--Power analysis early in the design cycle is critical for the design of lowpower systems. With the move to system-level specifications and design methodologies, there has ...
FGCN
2008
IEEE
14 years 2 months ago
2008
IEEE
Power consumption is becoming a primary concern as a result of tremendous increasing in computer power usage. Innumerable methods and techniques have been exploited to address thi...
ASPDAC
2009
ACM
14 years 2 months ago
2009
ACM
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a major reliability concern in present-day digital circuit design. Further, with the recent usage of...
CHES
2003
Springer
14 years 26 days ago
2003
Springer
We introduce multi-channel attacks, i.e., side-channel attacks which utilize multiple side-channels such as power and EM simultaneously. We propose an adversarial model which combi...
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
Economic incentives have driven the semiconductor industry to separate design from fabrication in recent years. This trend leads to potential vulnerabilities from untrusted circui...