40 search results - page 4 / 8 » Evaluating coverage of error detection logic for soft errors... |
DATE
2000
IEEE
14 years 29 days ago
2000
IEEE
: IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supply and speed. By approaching these limits, circuits are becoming increasingly ...
ICCAD
2007
IEEE
14 years 5 months ago
2007
IEEE
While circuit density and power efficiency increase with each major advance in IC technology, reliability with respect to soft errors tends to decrease. Current solutions to this...
ESWS
2009
Springer
14 years 3 months ago
2009
Springer
Abstract. We propose a general method and novel algorithmic techniques to facilitate the integration of independently developed ontologies using mappings. Our method and techniques...
CODES
2004
IEEE
14 years 8 days ago
2004
IEEE
In this paper, a novel method for high-level specification and validation of SoC designs using UML is proposed. UML is introduced as a formal model of specification for SoC design...
PRDC
2008
IEEE
14 years 2 months ago
2008
IEEE
Reliability has become a serious concern as systems embrace nanometer technologies. In this paper, we propose a novel approach for organizing redundancy that provides high degree ...