In recent technology nodes, reliability is considered a part of the standard design flow at all levels of embedded system design. While techniques that use only low-level models at...
Michael A. Kochte, Christian G. Zoellin, Rafal Bar...
In deep sub-micron ICs, growing amounts of ondie memory and scaling effects make embedded memories increasingly vulnerable to reliability and yield problems. As scaling progresses...
Jangwoo Kim, Nikos Hardavellas, Ken Mai, Babak Fal...
Embedded processor-based systems allow for the tailoring of the on-chip memory architecture based on application-specific requirements. We present an analytical strategy for explo...
Preeti Ranjan Panda, Nikil D. Dutt, Alexandru Nico...
In this paper, we present an architecture exploration methodology for low-end embedded systems where the reduction of cost is a primary design concern. The architecture exploratio...
The paper presents results of experimental dependability evaluation of the Phoenix-RTOS operating system. Experiments are conducted using a self-developed testing environment and ...