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DATE
2009
IEEE
125views Hardware» more  DATE 2009»
14 years 3 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu
DATE
2008
IEEE
163views Hardware» more  DATE 2008»
14 years 3 months ago
Design flow for embedded FPGAs based on a flexible architecture template
Modern digital signal processing applications have an increasing demand for computational power while needing to preserve low power dissipation and high flexibility. For many appl...
B. Neumann, Thorsten von Sydow, Holger Blume, Tobi...
TCAD
2008
136views more  TCAD 2008»
13 years 8 months ago
A Geometric Programming-Based Worst Case Gate Sizing Method Incorporating Spatial Correlation
We present an efficient optimization scheme for gate sizing in the presence of process variations. Our method is a worst-case design scheme, but it reduces the pessimism involved i...
Jaskirat Singh, Zhi-Quan Luo, Sachin S. Sapatnekar
SIGSOFT
2009
ACM
14 years 9 months ago
Darwin: an approach for debugging evolving programs
Debugging refers to the laborious process of finding causes of program failures. Often, such failures are introduced when a program undergoes changes and evolves from a stable ver...
Dawei Qi, Abhik Roychoudhury, Zhenkai Liang, Kapil...
RECOMB
2002
Springer
14 years 9 months ago
Comparison of minisatellites
In the class of repeated sequences that occur in DNA, minisatellites have been found polymorphic and became useful tools in genetic mapping and forensic studies. They consist of a...
Eric Rivals, Sèverine Bérard