Sciweavers

469 search results - page 19 / 94
» Evolutionary Approach to Test Generation for Functional BIST
Sort
View
VTS
2002
IEEE
120views Hardware» more  VTS 2002»
14 years 18 days ago
Software-Based Weighted Random Testing for IP Cores in Bus-Based Programmable SoCs
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...
Madhu K. Iyer, Kwang-Ting Cheng
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
14 years 1 months ago
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
Prabhat Mishra, Nikil D. Dutt
TCAD
2010
102views more  TCAD 2010»
13 years 2 months ago
Functional Test Generation Using Efficient Property Clustering and Learning Techniques
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...
Mingsong Chen, Prabhat Mishra
DATE
2006
IEEE
111views Hardware» more  DATE 2006»
14 years 1 months ago
Functional test generation using property decompositions for validation of pipelined processors
Functional validation is a major bottleneck in pipelined processor design. Simulation using functional test vectors is the most widely used form of processor validation. While exi...
Heon-Mo Koo, Prabhat Mishra
IICAI
2007
13 years 9 months ago
Automated Test Generation from Models Based on Functional Software Specifications
The paper presents first results of a project that aims at building a model-based tool for functional testing of control software for passenger vehicles. The objective is that this...
Michael Esser, Peter Struss