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» Evolutionary Approach to Test Generation for Functional BIST
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138
Voted
VTS
2002
IEEE
120views Hardware» more  VTS 2002»
15 years 8 months ago
Software-Based Weighted Random Testing for IP Cores in Bus-Based Programmable SoCs
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...
Madhu K. Iyer, Kwang-Ting Cheng
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
15 years 9 months ago
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
Prabhat Mishra, Nikil D. Dutt
TCAD
2010
102views more  TCAD 2010»
14 years 10 months ago
Functional Test Generation Using Efficient Property Clustering and Learning Techniques
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...
Mingsong Chen, Prabhat Mishra
DATE
2006
IEEE
111views Hardware» more  DATE 2006»
15 years 9 months ago
Functional test generation using property decompositions for validation of pipelined processors
Functional validation is a major bottleneck in pipelined processor design. Simulation using functional test vectors is the most widely used form of processor validation. While exi...
Heon-Mo Koo, Prabhat Mishra
133
Voted
IICAI
2007
15 years 4 months ago
Automated Test Generation from Models Based on Functional Software Specifications
The paper presents first results of a project that aims at building a model-based tool for functional testing of control software for passenger vehicles. The objective is that this...
Michael Esser, Peter Struss