469 search results - page 2 / 94 » Evolutionary Approach to Test Generation for Functional BIST |
VTS
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper presents a BIST architecture for Finite State Machines that exploits Cellular Automata (CA) as pattern generators and signature analyzers. The main advantage of the pro...
ITC
1999
IEEE
13 years 11 months ago
1999
IEEE
This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs. These multi-clock designs, ranging in size from 200K t...
VTS
2005
IEEE
14 years 14 days ago
2005
IEEE
This paper presents a pseudo-functional BIST scheme that attempts to minimize the over-testing problem of logic BIST for delay and crosstalk-induced failures. The over-testing pro...
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
Abstract— We present a general method to evaluate RF BuiltIn Self-Test (BIST) techniques during the design stage. In particular, the adaptive kernel estimator is used to construc...
COR
2008
13 years 7 months ago
2008
Evolutionary Testing is a promising approach for automating the testing of software-based systems. A number of papers have been published in the last years which have successfully...