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DATE
2007
IEEE
138views Hardware» more  DATE 2007»
14 years 1 months ago
An ADC-BiST scheme using sequential code analysis
This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysi...
Erdem Serkan Erdogan, Sule Ozev
DATE
1999
IEEE
102views Hardware» more  DATE 1999»
13 years 11 months ago
Minimal Length Diagnostic Tests for Analog Circuits using Test History
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
Alfred V. Gomes, Abhijit Chatterjee
CAI
2004
Springer
13 years 6 months ago
An Evolvable Combinational Unit for FPGAs
A complete hardware implementation of an evolvable combinational unit for FPGAs is presented. The proposed combinational unit consisting of a virtual reconfigurable circuit and evo...
Lukás Sekanina, Stepan Friedl
DATE
1999
IEEE
101views Hardware» more  DATE 1999»
13 years 11 months ago
Polynomial Methods for Allocating Complex Components
Methods for performing component matching by expressing an arithmetic specification and a bit-level description of an implementation as word-level polynomials have been demonstrat...
James Smith, Giovanni De Micheli
ISLPED
1997
ACM
130views Hardware» more  ISLPED 1997»
13 years 10 months ago
K2: an estimator for peak sustainable power of VLSI circuits
New measures of peak power in the context of sequential circuits are proposed. This paper presents an automatic procedure to obtain very good lower bounds on these measures as wel...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...