This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysi...
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
A complete hardware implementation of an evolvable combinational unit for FPGAs is presented. The proposed combinational unit consisting of a virtual reconfigurable circuit and evo...
Methods for performing component matching by expressing an arithmetic specification and a bit-level description of an implementation as word-level polynomials have been demonstrat...
New measures of peak power in the context of sequential circuits are proposed. This paper presents an automatic procedure to obtain very good lower bounds on these measures as wel...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...