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VLSID
2001
IEEE
144views VLSI» more  VLSID 2001»
14 years 7 months ago
Next Generation Network Processors
Networking hardware manufacturers face the dual demands of supporting ever increasing bandwidth requirements, while also delivering new features, such as the ability to implement ...
Deepak Kataria
ITC
2000
IEEE
80views Hardware» more  ITC 2000»
13 years 11 months ago
A stand-alone integrated test core for time and frequency domain measurements
An area efficient and robust integrated test core for mixed-signal circuits is described. The core consists of a completely digital implementation, except for a simple reconstructi...
Mohamed Hafed, Nazmy Abaskharoun, Gordon W. Robert...
DSD
2005
IEEE
96views Hardware» more  DSD 2005»
13 years 8 months ago
Improvement of the Fault Coverage of the Pseudo-Random Phase in Column-Matching BIST
Several methods improving the fault coverage in mixed-mode BIST are presented in this paper. The test is divided into two phases: the pseudo-random and deterministic. Maximum of f...
Peter Filter, Hana Kubatova
DAC
2006
ACM
14 years 7 months ago
Optimal simultaneous mapping and clustering for FPGA delay optimization
Both technology mapping and circuit clustering have a large impact on FPGA designs in terms of circuit performance, area, and power dissipation. Existing FPGA design flows carry o...
Joey Y. Lin, Deming Chen, Jason Cong
DATE
2005
IEEE
128views Hardware» more  DATE 2005»
14 years 9 days ago
On the Optimal Design of Triple Modular Redundancy Logic for SRAM-based FPGAs
Triple Modular Redundancy (TMR) is a suitable fault tolerant technique for SRAM-based FPGA. However, one of the main challenges in achieving 100% robustness in designs protected b...
Fernanda Lima Kastensmidt, Luca Sterpone, Luigi Ca...