This paper presents experimental results of fast intrinsic evolutionary design and evolutionary fault recovery of a 4-bit Digital to Analog Converter (DAC) using the JPL stand-alo...
Ricardo Salem Zebulum, Didier Keymeulen, Vu Duong,...
Post-silicon debug is the problem of determining what's wrong when the fabricated chip of a new design behaves incorrectly. This problem now consumes over half of the overall ...
Flavio M. de Paula, Marcel Gort, Alan J. Hu, Steve...
— Since rapid progress has been made in device improvement and integration of small carbon nanotube fieldeffect transistors (CNFETs) circuits, the time has come for developing c...
Abstract— This paper addresses the problem of solving finite word-length (bit-vector) arithmetic with applications to equivalence verification of arithmetic datapaths. Arithmet...
Test scheduling and Test Access Mechanism (TAM) design are two important tasks in the development of a System-on-Chip (SOC) test solution. Previous test scheduling techniques assu...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...