420 search results - page 6 / 84 » Fault Analysis Study of IDEA |
DDECS
2007
IEEE
14 years 4 months ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
ISSRE
2002
IEEE
14 years 2 months ago
2002
IEEE
A number of strategies have been proposed for state-based class testing. An important proposal was made by Chow [5] and adapted by Binder [3]: It consists in deriving test sequenc...
ETS
2010
IEEE
13 years 8 months ago
2010
IEEE
ÑIn this paper, we present a comparative study on the effects of resistive-bridging defects in the SRAM core-cells, considering different technology nodes. In particular, we analy...
FTCS
1997
13 years 11 months ago
1997
In this paper the consolidate identification of faults, distinguished as transient or permanent/intermittent, is approached. Transient faults discrimination has long been performe...
FPL
2004
Springer
14 years 3 months ago
2004
Springer
Abstract. We present an evaluation of accelerating fault simulation by hardware emulation on FPGA. Fault simulation is an important subtask in test pattern generation and it is fre...