195 search results - page 5 / 39 » Fault Analysis of DPA-Resistant Algorithms |
TSE
2010
13 years 5 months ago
2010
This paper presents an innovative model of a program’s internal behavior over a set of test inputs, called the probabilistic program dependence graph (PPDG), that facilitates pr...
ASPDAC
2001
ACM
13 years 11 months ago
2001
ACM
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...
ATS
2010
IEEE
13 years 5 months ago
2010
IEEE
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...
VTS
2006
IEEE
14 years 1 months ago
2006
IEEE
A new algorithm for identifying stuck faults in combinational circuits that cannot be detected by a given input sequence is presented. Other than pre and post-processing steps, ce...
ISQED
2002
IEEE
14 years 12 days ago
2002
IEEE
The reliability of ADCs used in highly critical systems can be increased by applying a two-step procedure starting with sensitivity analysis followed by redesign. The sensitivity ...