Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Model-Based Diagnosis (MBD) typically focuses on diagnoses, minimal under some minimality criterion, e.g., the minimal-cardinality set of faulty components that explain an observa...
Alexander Feldman, Gregory M. Provan, Arjan J. C. ...
Abstract. Balanced asynchronous circuits have been touted as a superior replacement for conventional synchronous circuits. To assess these claims, we have designed, manufactured an...
Jacques J. A. Fournier, Simon W. Moore, Huiyun Li,...
In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...
Samitha Samaranayake, Emil Gizdarski, Nodari Sitch...
This paper presents a new test response compaction technique with any number of unknown logic values (X’s) in the test response bits. The technique leverages an X-tolerant respo...