We define a new type of test, called “concurrent test,” for a combinational circuit. Given a set of target faults, a concurrent-test is an input vector that detects all (or m...
Researchers are looking for alternatives to overcome the upcoming limits of conventional hardware technologies. Reversible logic thereby established itself as a promising directio...
Jean Christoph Jung, Stefan Frehse, Robert Wille, ...
The single stuck-at fault coverage is often seen as a figure-of-merit also for scan testing according to other fault models like transition faults, bridging faults, crosstalk faul...
We study recent developments in quantum computing (QC) testing and fault tolerance (FT) techniques and discuss several attempts to formalize quantum logic fault models. We illustr...
David Y. Feinstein, V. S. S. Nair, Mitchell A. Tho...