As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...
Andrew DeOrio, Konstantinos Aisopos, Valeria Berta...
Abstract. Enterprise-system upgrades are unreliable and often produce downtime or data-loss. Errors in the upgrade procedure, such as broken dependencies, constitute the leading ca...
Fault tolerance schemes for mobile agents to survive agent server crash failures are complex since developers normally have no control over remote agent servers. Some solutions mo...
As technology scales ever further, device unreliability is creating excessive complexity for hardware to maintain the illusion of perfect operation. In this paper, we consider whe...
Marc de Kruijf, Shuou Nomura, Karthikeyan Sankaral...
Two schemes proposed to cope with unrecoverable or latent media errors and enhance the reliability of RAID systems are examined. The first scheme is the established, widely used d...
Ilias Iliadis, Robert Haas, Xiao-Yu Hu, Evangelos ...