We describe a method for designing fault tolerant circuits based on an extension of a Concurrent Error Detection (CED) technique. The proposed extension combines parity check code...
Abstract—Continuously shrinking feature sizes cause an increasing vulnerability of digital circuits. Manufacturing failures and transient faults may tamper the functionality. Aut...
The ability to guarantee that a system will continue to operate correctly under degraded conditions is key to the success of adopting multi-agent systems (MAS) as a paradigm for d...
Abstract— The promise of next-generation computer technologies, such as nano-electronics, implies a number of serious alterations to the design flow of digital circuits. One of ...
Soft error tolerant design becomes more crucial due to exponential increase in the vulnerability of computer systems to soft errors. Accurate estimation of soft error rate (SER), ...