327 search results - page 9 / 66 » Fault emulation: a new approach to fault grading |
SIGSOFT
2006
ACM
14 years 8 months ago
2006
ACM
Recent software systems usually feature an automated failure reporting system, with which a huge number of failing traces are collected every day. In order to prioritize fault dia...
DFT
1999
IEEE
14 years 6 days ago
1999
IEEE
In this paper, we present a memory fault simulator called the Random Access Memory Simulator for Error Screening (RAMSES). Although it was designed based on some wellknown memory ...
TCAD
2008
13 years 7 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
ITC
1998
IEEE
14 years 4 days ago
1998
IEEE
A deterministic BIST scheme for circuits with multiple scan paths is presented. A procedure is described for synthesizing a pattern generator which stimulates all scan chains simu...
ASPDAC
2004
ACM
14 years 1 months ago
2004
ACM
— This paper presents a SAT-based ATPG tool targeting on a path-oriented transition fault model. Under this fault model, a transition fault is detected through the longest sensit...