75 search results - page 8 / 15 » Fault tolerant methods for reliability in FPGAs |
DAC
2002
ACM
14 years 10 months ago
2002
ACM
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed test of high-speed microprocessors using low-cost testers. We explore the fault diagnos...
DATE
2009
IEEE
14 years 4 months ago
2009
IEEE
—Flash-based FPGAs are increasingly demanded in safety critical fields, in particular space and avionic ones, due to their non-volatile configuration memory. Although they are al...
IJNSEC
2008
13 years 9 months ago
2008
We present a hybrid group key management protocol that incorporates both a centralized and a contributory scheme for key management, and a tree-based Elliptic Curve Diffie-Hellman...
ISLPED
2005
ACM
14 years 3 months ago
2005
ACM
Reducing power dissipation and testing time is accomplished by forming two clusters of don’t-care bit inside an input and a response test cube. New reordering scheme of scan lat...
ICPP
2007
IEEE
14 years 4 months ago
2007
IEEE
The productivity of HPC system is determined not only by their performance, but also by their reliability. The conventional method to limit the impact of failures is checkpointing...