1352 search results - page 218 / 271 » Fault-Tolerant Quantum Computation |
CSE
2007
IEEE
13 years 8 months ago
2007
IEEE
DAC
2009
ACM
14 years 9 months ago
2009
ACM
Post-silicon processor debugging is frequently carried out in a loop consisting of several iterations of the following two key steps: (i) processor execution for some duration, fo...
DAC
2007
ACM
14 years 9 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
DAC
2007
ACM
14 years 9 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
DAC
2001
ACM
14 years 9 months ago
2001
ACM
This paper presents the design and evaluation of an 8-bit adiabatic multiplier. Both the multiplier core and its built-in self-test logic have been designed using a true single-ph...