107 search results - page 17 / 22 » Fixed-Polynomial Size Circuit Bounds |
VTS
2007
IEEE
14 years 1 months ago
2007
IEEE
—As the complexity of the integrated circuits increases, they become more susceptible to manufacturing faults, decreasing the total process yield. Thus, it would be desirable to ...
DAGSTUHL
2006
13 years 9 months ago
2006
This paper presents the optimal compression for sequences with undefined values. Let we have (N -m) undefined and m defined positions in the boolean sequence V of length N. The se...
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
As VLSI technology reaches 45nm technology node, leakage power optimization has become a major design challenge. Threshold voltage (vt) assignment has been extensively studied, du...
TIT
2008
13 years 7 months ago
2008
We study the task of transforming a hard function f, with which any small circuit disagrees on (1 - )/2 fraction of the input, into a harder function f , with which any small circ...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
The importance of testing approaches that exploit error tolerance to improve yield has previously been established. Error rate, defined as the percentage of vectors for which the...