1446 search results - page 105 / 290 » Formal analysis of hardware requirements |
ICCAD
2006
IEEE
14 years 6 months ago
2006
IEEE
The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer circuit design. High voltages resulted from ESD might cause high current densitie...
ICCAD
2001
IEEE
14 years 6 months ago
2001
IEEE
In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
ISQED
2005
IEEE
14 years 3 months ago
2005
IEEE
This paper presents a two-step, RC-interconnect insensitive linear time-varying (LTV) driver model for gate-level timing calculation. We show how to characterize a driver with the...
CARDIS
2010
Springer
14 years 4 months ago
2010
Springer
At ACISP 2004, Giraud and Knudsen presented the first fault analysis of DSA, ECDSA, XTR-DSA, Schnorr and ElGamal signatures schemes that considered faults affecting one byte. The...
CODES
2007
IEEE
14 years 4 months ago
2007
IEEE
The design and analysis of today’s complex real-time systems requires advanced methods. Due to ever growing functionality, hardware complexity and component interaction, applyin...