1446 search results - page 106 / 290 » Formal analysis of hardware requirements |
DATE
2006
IEEE
14 years 4 months ago
2006
IEEE
It is anticipated that self assembled ultra-dense nanomemories will be more susceptible to manufacturing defects and transient faults than conventional CMOS-based memories, thus t...
ITC
2000
IEEE
14 years 2 months ago
2000
IEEE
Transient Signal Analysis (TSA) is a Go/No-Go device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, a technique based o...
CARDIS
2008
Springer
14 years 10 days ago
2008
Springer
The Java Card API provides a framework of classes and interfaces that hides the details of the underlying smart card interface, thus relieving developers from going through the swa...
ICCAD
2008
IEEE
14 years 7 months ago
2008
IEEE
– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...
ICCAD
2005
IEEE
14 years 7 months ago
2005
IEEE
State-equivalence based reduction techniques, e.g. bisimulation minimization, can be used to reduce a state transition system to facilitate subsequent verification tasks. However...