Sciweavers

202 search results - page 21 / 41
» Framework for Fault Analysis and Test Generation in DRAMs
Sort
View
TOOLS
2000
IEEE
13 years 11 months ago
Testing-for-Trust: The Genetic Selection Model Applied to Component Qualification
This paper presents a method and a tool for building trustable OO components. The methodology is based on an integrated design and test approach for OO software components. It is ...
Benoit Baudry, Vu Le Hanh, Yves Le Traon
IMC
2004
ACM
14 years 25 days ago
A framework for malicious workload generation
Malicious traffic from self-propagating worms and denialof-service attacks constantly threatens the everyday operation of Internet systems. Defending networks from these threats d...
Joel Sommers, Vinod Yegneswaran, Paul Barford
ICCAD
1999
IEEE
86views Hardware» more  ICCAD 1999»
13 years 11 months ago
A framework for testing core-based systems-on-a-chip
Available techniques for testing core-based systems-on-a-chip (SOCs) do not provide a systematic means for synthesising low-overhead test architectures and compact test solutions....
Srivaths Ravi, Ganesh Lakshminarayana, Niraj K. Jh...
VTS
2008
IEEE
119views Hardware» more  VTS 2008»
14 years 1 months ago
Error Sequence Analysis
With increasing IC process variation and increased operating speed, it is more likely that even subtle defects will lead to the malfunctioning of a circuit. Various fault models, ...
Jaekwang Lee, Intaik Park, Edward J. McCluskey
ICCS
2005
Springer
14 years 28 days ago
Model-Based Statistical Testing of a Cluster Utility
Abstract. As High Performance Computing becomes more collaborative, software certification practices are needed to quantify the credibility of shared applications. To demonstrate q...
W. Thomas Swain, Stephen L. Scott