153 search results - page 9 / 31 » From Philosophical to Industrial Logics |
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
This paper presents a concurrent error detection technique targeted towards control logic in a processor with emphasis on low area overhead. Rather than detect all modeled transie...
ASPDAC
2008
ACM
13 years 9 months ago
2008
ACM
With continued scaling of technology into nanometer regimes, the impact of coupling induced delay variations is significant. While several coupling-aware static timers have been pr...
ETFA
2005
IEEE
14 years 29 days ago
2005
IEEE
Industrial control systems architectures have been evolving to the decentralization of control tasks. This evolution associated with the time-critical nature of these tasks, incre...
ITC
2003
IEEE
14 years 19 days ago
2003
IEEE
Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...
TODAES
2002
13 years 7 months ago
2002
ct Cross-coupled noise analysis has become a critical concern in today's VLSI designs. Typically, noise analysis makes an assumption that all aggressing nets can simultaneousl...