192 search results - page 15 / 39 » Functional Scan Chain Testing |
VTS
2003
IEEE
14 years 2 months ago
2003
IEEE
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
ICCD
2003
IEEE
14 years 2 months ago
2003
IEEE
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
FCCM
2009
IEEE
14 years 3 months ago
2009
IEEE
BLASTn is a tool universally used by biologists to identify similarities between nucleotide based biological genome sequences. This report describes an FPGA based hardware impleme...
RECONFIG
2009
IEEE
14 years 3 months ago
2009
IEEE
BLASTn is a ubiquitous tool used for large scale DNA analysis. Detailed profiling tests reveal that the most computationally intensive sections of the BLASTn algorithm are the sc...
DFT
2005
IEEE
13 years 11 months ago
2005
IEEE
A built-in self-test (BIST) scheme is presented which both reduces overhead for detecting random-pattern-resistant (r.p.r.) faults as well as reduces power consumption during test...