192 search results - page 5 / 39 » Functional Scan Chain Testing |
ISQED
2010
IEEE
14 years 2 months ago
2010
IEEE
— This paper proposes a two-dimensional scan shift control concept for multiple scan chain design. Multiple scan chain test scheme provides very low scan power by skipping many l...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
Keeping diagnostic resolution as high as possible while maximizing the compaction ratio is subject to research since the advent of embedded test. In this paper, we present a novel...
ATS
2009
IEEE
14 years 3 months ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...
ATS
2009
IEEE
14 years 3 months ago
2009
IEEE
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-...
DELTA
2008
IEEE
14 years 3 months ago
2008
IEEE
Scan is a widely used design-for-testability technique to improve test and diagnosis quality, however, scan chain failures account for almost 50% of chip failures. In this paper, ...