192 search results - page 6 / 39 » Functional Scan Chain Testing |
VTS
2003
IEEE
14 years 2 months ago
2003
IEEE
In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...
DATE
2009
IEEE
14 years 3 months ago
2009
IEEE
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
VTS
1997
IEEE
14 years 1 months ago
1997
IEEE
A new approach for testing the bistable elements (latches and flip-flops) in scan chain circuits is presented. In this approach, we generate test patterns that apply a checking ex...
ASPDAC
2006
ACM
14 years 3 months ago
2006
ACM
Abstract— For scan-based testing, the high test power consumption may cause test power management problems, and the extra scan chain connections may cause routability degradation...
ET
2002
13 years 8 months ago
2002
The paper presents a method for testing a system-on-achip by using a compressed representation of the patterns on an external tester. The patterns for a certain core under test ar...