123 search results - page 13 / 25 » Functional Test Generation for FSMs by Fault Extraction |
ISMVL
2007
IEEE
14 years 1 months ago
2007
IEEE
The clock rate of modern chips is still increasing and at the same time the gate size decreases. As a result, already slight variations during the production process may cause a f...
MTV
2006
IEEE
14 years 1 months ago
2006
IEEE
Simulation-based validation of the current industrial processors typically use huge number of test programs generated at instruction set architecture (ISA) level. However, archite...
ISVLSI
2007
IEEE
14 years 1 months ago
2007
IEEE
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
ISSRE
2008
IEEE
14 years 1 months ago
2008
IEEE
Aspect-Oriented Programming (AOP) provides new modularization of software systems by encapsulating crosscutting concerns. AspectJ, an AOP language, uses abstractions such as point...
VTS
2007
IEEE
14 years 1 months ago
2007
IEEE
In this paper, we identify two main bottlenecks in the functional diagnosis flow and propose new ways to overcome these. Our approach completely eliminates the “Primary Input (P...