174 search results - page 14 / 35 » Functional Test Generation for Full Scan Circuits |
RECONFIG
2009
IEEE
14 years 5 months ago
2009
IEEE
BLASTn is a ubiquitous tool used for large scale DNA analysis. Detailed profiling tests reveal that the most computationally intensive sections of the BLASTn algorithm are the sc...
GLVLSI
2005
IEEE
14 years 4 months ago
2005
IEEE
We develop a neural network that learns to separate the nominal from the faulty instances of a circuit in a measurement space. We demonstrate that the required separation boundari...
ICCAD
1994
IEEE
14 years 2 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...
DAC
2006
ACM
14 years 11 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
ATS
2005
IEEE
14 years 4 months ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...