82 search results - page 3 / 17 » Functional Testing of Microprocessors with Graded Fault Cove... |
GLVLSI
1999
IEEE
13 years 11 months ago
1999
IEEE
This paper proposes a new fault coverage estimation model which can be used in the early stage of VLSI design. The fault coverage model is an exponentially decaying function with ...
TCAD
2008
13 years 7 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
ICCD
2007
IEEE
14 years 4 months ago
2007
IEEE
This paper addresses the run-time diagnosis of delay faults in functional units of microprocessors. Despite the popularity of the stuck-at fault model, it is no longer the only re...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
1 The first path implicit and exact non–robust path delay fault grading technique for non–scan sequential circuits is presented. Non enumerative exact coverage is obtained, b...
ATS
2000
IEEE
13 years 12 months ago
2000
IEEE
: In this paper a complete analysis of spot defects in industrial SRAMs will be presented. All possible defects are simulated, and the resulting electrical faults are transformed i...