138 search results - page 3 / 28 » Functional test generation for delay faults in combinational... |
DFT
2003
IEEE
14 years 29 days ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...
ASPDAC
2005
ACM
13 years 9 months ago
2005
ACM
Recent research results have shown that the traditional structural testing for delay and crosstalk faults may result in over-testing due to the non-trivial number of such faults t...
DATE
1999
IEEE
13 years 12 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
IOLTS
2000
IEEE
14 years 1 days ago
2000
IEEE
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...