18 search results - page 3 / 4 » GATTO: An Intelligent Tool for Automatic Test Pattern Genera... |
INTEGRATION
2006
13 years 6 months ago
2006
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
ASPDAC
2009
ACM
14 years 1 months ago
2009
ACM
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...
FPL
2001
Springer
13 years 11 months ago
2001
Springer
Abstract. Visual data
ow environments are ideally suited for modeling digital signal processing (DSP) systems, as many DSP algorithms are most naturally speci ed by signal
ow gra...
DT
2000
13 years 6 months ago
2000
Effective high-level ATPG tools are increasingly needed, as an essential element in the quest for reducing as much as possible the designer work on gate-level descriptions. We pro...
ICCAD
2002
IEEE
14 years 3 months ago
2002
IEEE
In this survey, we outline basic SAT- and ATPGprocedures as well as their applications in formal hardware verification. We attempt to give the reader a trace trough literature and...