268 search results - page 43 / 54 » Gating currents |
VLSID
2007
IEEE
14 years 7 months ago
2007
IEEE
Device scaling such as reduced oxide thickness and high electric field has given rise to various reliability concerns. One such growing issue of concern is the degradation of PMOS...
EUROSYS
2008
ACM
14 years 4 months ago
2008
ACM
Non-uniform utilization of functional units in combination with hardware mechanisms such as clock gating leads to different power consumptions in different parts of a processor ch...
ICCD
2003
IEEE
14 years 4 months ago
2003
IEEE
There is currently a huge gap between the two main technologies used to implement custom digital integrated circuit (IC) designs. At one end of the spectrum are field programmable...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
This paper proposes an optimum methodology for assigning supply and threshold voltages to modules in a CMOS circuit such that the overall energy consumption is minimized for a giv...
ISPD
2010
ACM
14 years 2 months ago
2010
ACM
As the thermal wall becomes the dominant factor limiting VLSI circuit performance, and the interconnect wires become the primary power consumer, power efficiency of onchip data th...