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ICCAD
2002
IEEE
116views Hardware» more  ICCAD 2002»
14 years 6 months ago
Conflict driven techniques for improving deterministic test pattern generation
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Xiji...
SIGCSE
2010
ACM
182views Education» more  SIGCSE 2010»
14 years 4 months ago
Frances: a tool for understanding code generation
Compiler and programming language implementation courses are integral parts of many computer science curricula. However, the range of topics necessary to teach in such a course ar...
Tyler Sondag, Kian L. Pokorny, Hridesh Rajan
AOSD
2009
ACM
14 years 3 months ago
Automated test data generation for aspect-oriented programs
Despite the upsurge of interest in the Aspect-Oriented Programming (AOP) paradigm, there remain few results on test data generation techniques for AOP. Furthermore, there is no wo...
Mark Harman, Fayezin Islam, Tao Xie, Stefan Wapple...
CEC
2009
IEEE
14 years 3 months ago
An evaluation of Differential Evolution in software test data generation
— One of the main tasks software testing involves is the generation of the test inputs to be used during the test. Due to its expensive cost, the automation of this task has beco...
Ricardo Landa Becerra, Ramón Sagarna, Xin Y...
AIED
2009
Springer
14 years 3 months ago
Generating Instruction Automatically for the Reading Strategy of Self-Questioning
Self-questioning is an important reading comprehension strategy, so it would be useful for an intelligent tutor to help students apply it to any given text. Our goal is to help chi...
Jack Mostow, Wei Chen