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DSD
2009
IEEE
71views Hardware» more  DSD 2009»
13 years 11 months ago
Representation of Incompletely Specified Index Generation Functions Using Minimal Number of Compound Variables
This paper shows a method to reduce the number of input variables to represent incompletely specified index generation functions. A compound variable is generated by EXORing the o...
Tsutomu Sasao, Takaaki Nakamura, Munehiro Matsuura
DATE
2002
IEEE
94views Hardware» more  DATE 2002»
14 years 20 days ago
FACTOR: A Hierarchical Methodology for Functional Test Generation and Testability Analysis
This paper develops an improved approach for hierarchical functional test generation for complex chips. In order to deal with the increasing complexity of functional test generati...
Vivekananda M. Vedula, Jacob A. Abraham
DAC
1999
ACM
14 years 1 days ago
Test Generation for Gigahertz Processors Using an Automatic Functional Constraint Extractor
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...
Raghuram S. Tupuri, Arun Krishnamachary, Jacob A. ...
DATE
2000
IEEE
139views Hardware» more  DATE 2000»
14 years 4 days ago
A VHDL Error Simulator for Functional Test Generation
This paper describes an efficient error simulator able to analyze functional VHDL descriptions. The proposed simulation environment can be based on commercial VHDL simulators. Al...
Alessandro Fin, Franco Fummi
STOC
2010
ACM
176views Algorithms» more  STOC 2010»
13 years 11 months ago
Efficiency Improvements in Constructing Pseudorandom Generators from One-Way Functions
We give a new construction of pseudorandom generators from any one-way function. The construction achieves better parameters and is simpler than that given in the seminal work of ...
Iftach Haitner, Omer Reingold and Salil Vadhan