62 search results - page 7 / 13 » Generation of Integration Tests for Self-Testing Components |
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
The verification of modern computing systems has grown to dominate the cost of system design, often with limited success as designs continue to be released with latent bugs. This t...
GLVLSI
2009
IEEE
14 years 1 months ago
2009
IEEE
1 Soft errors caused by cosmic particles and radiation emitted by the packaging are an important problem in contemporary microprocessors. Parity bits are used to detect single bit ...
3DGIS
2006
Springer
14 years 3 months ago
2006
Springer
Abstract Three-dimensional (3D) building model is one of the most important components in a cyber city implementation and application. This study developed an effective and highly ...
DATE
2008
IEEE
14 years 4 months ago
2008
IEEE
As semiconductor manufacturing requires greater capital investments, the use of contract foundries has grown dramatically, increasing exposure to mask theft and unauthorized exces...
JOT
2007
13 years 9 months ago
2007
In order to integrate requirements into the current Model-Driven Engineering (MDE) approach, the traditional document-based requirements specification process should be changed in...