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ASAP
2005
IEEE
165views Hardware» more  ASAP 2005»
14 years 2 months ago
CONAN - A Design Exploration Framework for Reliable Nano-Electronics
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...
Sorin Cotofana, Alexandre Schmid, Yusuf Leblebici,...
ECAI
2004
Springer
14 years 1 months ago
High-Level Observations in Java Debugging
Recent years have seen considerable developments in modeling techniques for automatic fault location in programs. However, much of this research considered the models from a standa...
Wolfgang Mayer, Markus Stumptner
IPPS
2003
IEEE
14 years 1 months ago
Evolutionary Fault Recovery in a Virtex FPGA Using a Representation that Incorporates Routing
Most evolutionary approaches to fault recovery in FPGAs focus on evolving alternative logic configurations as opposed to evolving the intra-cell routing. Since the majority of tra...
Jason D. Lohn, Gregory V. Larchev, Ronald F. DeMar...
ISQED
2002
IEEE
203views Hardware» more  ISQED 2002»
14 years 1 months ago
Automatic Test Program Generation from RT-Level Microprocessor Descriptions
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
IPPS
2006
IEEE
14 years 2 months ago
Parallel genetic algorithm for SPICE model parameter extraction
Models of simulation program with integrated circuit emphasis (SPICE) are currently playing a central role in the connection between circuit design and chip fabrication communitie...
Yiming Li, Yen-Yu Cho