An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU robustne...
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...
For a logic design with level-sensitive latches, we need to validate timing signal paths which may flush through several latches. We developed efficient algorithms based on the mo...
This paper discusses a model-based design flow for requirements in distributed embedded software development. Such requirements are specified using a language similar to Linear T...
Luciano Lavagno, Marco Di Natale, Alberto Ferrari,...
In this paper we present a power dissipation model considering the charging/discharging of capacitance at the gate output node as well as internal nodes, and capacitance feedthrou...