Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
Soft errors are an increasingly serious problem for logic circuits. To estimate the effects of soft errors on such circuits, we develop a general computational framework based on ...
Smita Krishnaswamy, George F. Viamontes, Igor L. M...
—Power and energy consumption has emerged as the premier and most constraining aspect in modern computational systems. Dynamic Voltage Scheduling (DVS) has been provably one of t...
Logic Soft Errors caused by radiation are a major concern when working with circuits that need to operate in harsh environments, such as space or avionics applications, where soft ...
Oscar Ruano, Pilar Reyes, Juan Antonio Maestro, Lu...
Reliability has become a serious concern as systems embrace nanometer technologies. In this paper, we propose a novel approach for organizing redundancy that provides high degree ...