Prior work on modeling interconnects has focused on optimizing the wire and repeater design for trading off energy and delay, and is largely based on low level circuit parameters....
Rahul Nagpal, Arvind Madan, Bharadwaj Amrutur, Y. ...
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
Modeling on-chip inductive effects for interconnects of multigigahertz microprocessors remains challenging. SPICE simulation of these effects is very slow because of the large num...
Xiaoning Qi, Goetz Leonhardt, Daniel Flees, Xiao-D...
The current paradigm of using Cu interconnects for on-chip global communication is rapidly becoming a serious performance bottleneck in ultra-deep submicron (UDSM) technologies. C...
Single-walled carbon nanotube (SWCNT) bundles have the potential to provide an attractive solution for the resistivity and electromigration problems faced by traditional copper int...