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IPPS
2002
IEEE
14 years 17 days ago
Fast Inductance Extraction of Large VLSI Circuits
Accurate estimation of signal delay is critical to the design and verification of VLSI circuits. At very high frequencies, signal delay in circuits with small feature sizes is do...
Hemant Mahawar, Vivek Sarin, Weiping Shi
ICCAD
2003
IEEE
119views Hardware» more  ICCAD 2003»
14 years 4 months ago
Analytical Bound for Unwanted Clock Skew due to Wire Width Variation
Under modern VLSI technology, process variations greatly affect circuit performance, especially clock skew which is very timing sensitive. Unwanted skew due to process variation f...
Anand Rajaram, Bing Lu, Wei Guo, Rabi N. Mahapatra...
TCAD
1998
95views more  TCAD 1998»
13 years 7 months ago
High-precision interconnect analysis
— Integrated circuits have evolved to a stage where interconnections significantly limit their performance and functional complexity. We introduce a set of tools to perform high...
Rui Martins, Wolfgang Pyka, Rainer Sabelka, Siegfr...
ASPDAC
2005
ACM
96views Hardware» more  ASPDAC 2005»
13 years 9 months ago
Oscillation ring based interconnect test scheme for SOC
- We propose a novel oscillation ring (OR) test architecture for testing interconnects in SoC. In addition to stuck-at and open faults, this scheme can detect delay faults and cr...
Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, ...
ISQED
2007
IEEE
123views Hardware» more  ISQED 2007»
14 years 1 months ago
General Block Structure-Preserving Reduced Order Modeling of Linear Dynamic Circuits
In this paper, we propose a generalized block structure-preserving reduced order interconnect macromodeling method (BSPRIM). Our approach extends structure-preserving model order ...
Ning Mi, Boyuan Yan, Sheldon X.-D. Tan, Jeffrey Fa...