59 search results - page 7 / 12 » Hierarchical Test Generation with Built-In Fault Diagnosis |
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
IEEEARES
2006
IEEE
14 years 1 months ago
2006
IEEE
There is an increasing demand for highly reliable systems in the safety conscious climate of today’s world. When a fault does occur there are two desirable outcomes. Firstly, de...
DAC
2002
ACM
14 years 8 months ago
2002
ACM
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed test of high-speed microprocessors using low-cost testers. We explore the fault diagnos...
DSD
2007
IEEE
14 years 1 months ago
2007
IEEE
Similar to sequential test pattern generation, the problem of identifying untestable faults in sequential circuits remains unsolved. Most of the previous works in untestability id...
ICCAD
1996
IEEE
13 years 11 months ago
1996
IEEE
This paper presents a new approach for diagnosing stuck-at and short faults in interconnects whose layouts are known. This structural approach exploits dierent graph coloring and ...