18572 search results - page 3521 / 3715 » High performance C |
DAC
2007
ACM
14 years 11 months ago
2007
ACM
With increasing time-to-market pressure and shortening semiconductor product cycles, more and more chips are being designed with library-based methodologies. In spite of this shif...
DAC
2003
ACM
14 years 11 months ago
2003
ACM
Skin effect makes interconnect resistance and inductance frequency dependent. This paper addresses the problem of efficiently estimating the signal characteristics of any RLC netw...
DAC
2004
ACM
14 years 11 months ago
2004
ACM
We present novel and efficient methods for on-line testing in FPGAs. The testing approach uses a ROving TEster (ROTE), which has provable diagnosabilities and is also faster than ...
DAC
2004
ACM
14 years 11 months ago
2004
ACM
Long design cycles due to the inability to predict silicon realities is a well-known problem that plagues analog/RF integrated circuit product development. As this problem worsens...
DAC
2006
ACM
14 years 11 months ago
2006
ACM
As the technology node advances into the nanometer era, via-open defects are one of the dominant failures. To improve via yield and reliability, redundant-via insertion is a highl...