290 search results - page 32 / 58 » High-Speed MARS Hardware |
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
This paper addresses error-resilience as the capability to tolerate bit-flips in a compressed test data stream (which is transferred from an Automatic Test Equipment (ATE) to the...
ICCAD
2003
IEEE
14 years 25 days ago
2003
IEEE
Domino circuits have been used in most modern high-performance microprocessor designs because of their high speed, low transistor-count and hazard-free operation. However, with te...
ITC
2003
IEEE
14 years 24 days ago
2003
IEEE
Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...
SBACPAD
2003
IEEE
14 years 24 days ago
2003
IEEE
Traffic monitoring and analysis based on general purpose systems with high speed interfaces, such as Gigabit Ethernet and 10 Gigabit Ethernet, requires carefully designed software...
DATE
2000
IEEE
13 years 12 months ago
2000
IEEE
In this paper, a new built-in self-test structure to test the static specifications of analog to digital converters (ADCs) is presented. A ramp signal generated by an integrator ...