76 search results - page 11 / 16 » Impact of NBTI on FPGAs |
FPL
2005
Springer
14 years 2 months ago
2005
Springer
Future process nodes have such small feature sizes that there will be an increase in the number of manufacturing defects per die. For large FPGAs, it will be critical to tolerate ...
IH
1998
Springer
14 years 28 days ago
1998
Springer
Advanced CAD tools and high-density VLSI technologies have combined to create a new market for reusable digital designs. The economic viability of the new core-based design paradig...
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
GLVLSI
2009
IEEE
14 years 3 months ago
2009
IEEE
In this paper, we propose novel architectural and design techniques for three-dimensional field-programmable gate arrays (3D FPGAs) with Through-Silicon Vias (TSVs). We develop a...
DAC
2006
ACM
14 years 9 months ago
2006
ACM
Aggressive scaling of technology has an adverse impact on the reliability of VLSI circuits. Apart from increasing transient error susceptibility, the circuits also become more vul...