32 search results - page 5 / 7 » Impact of Process and Temperature Variations on Network-on-C... |
ISQED
2009
IEEE
14 years 3 months ago
2009
IEEE
—As device feature size continues to shrink, reliability becomes a severe issue due to process variation, particle-induced transient errors, and transistor wear-out/stress such a...
VLSID
2006
IEEE
14 years 2 months ago
2006
IEEE
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...
MICRO
2007
IEEE
14 years 2 months ago
2007
IEEE
Aggressive technology scaling over the years has helped improve processor performance but has caused a reduction in processor reliability. Shrinking transistor sizes and lower sup...
JCP
2008
13 years 8 months ago
2008
Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...
TMC
2010
13 years 7 months ago
2010
We explore the use of clock skew of a wireless local area network access point (AP) as its fingerprint to detect unauthorized APs quickly and accurately. The main goal behind usi...